Numerical Analysis of Current versus Voltage Characteristics by Triangular Voltage Sweep in SiO_2 Film
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概要
- 論文の詳細を見る
Current versus voltage characteristics by the triangular voltage sweep method are measured on mobile Na^+ ions in the SiO_2 film and the results are analyzed numerically. The voltage at which current becomes maximum shifts as the voltage sweep rate changes. This phenomenon cannot be explainaed by conventional quasi-equilibrium analysis, but is clearly expressed by the present numerical analysis. Asymmetry of current peaks for the positive and the negative sweep are interpreted by introducing ionic traps. The trap depths are estimated by an analysis of temperature dependence and discussed by a comparison with results of the thermally stimulated current.
- 社団法人応用物理学会の論文
- 1982-10-20
著者
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Hino Taro
Department Of Electrical And Electronic Engineering Faculty Of Engineering Tokyo Institute Of Techno
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Yamashita Ken
Department Of Electrical And Electronic Engineering Faculty Of Engineering Tokyo Institute Of Techno
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Yamashita Ken
Department Of Electrical And Electronic Engineering Faculty Of Engineering Tokyo Institute Of Techno
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