Medium Field Breakdown Origin on Metal Oxide Semiconductor Capacitor Containing Grown-in Czochralski Silicon Crystal Defects

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Study of Applicability of AC Photovoltaic Method and Photoconductive Decay Method Using Microwaves as Noncontact Methods for Bulk Lifetime Measurement
Medium Field Breakdown Origin on Metal Oxide Semiconductor Capacitor Containing Grown-in Czochralski Silicon Crystal Defects
Medium Field Breakdown Following Local Tunneling Current on MOS Capacitor Containing Grown-in CZ Crystal Defects
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Investigation on Defects in Czochralski Silicon with High-Sensitive Laser/Microwave Photoconductance Technique

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