KITAGAWARA Yutaka | SEH Isobe R & D Center, Shin-Etsu Handotai Co., Ltd.
スポンサーリンク
概要
関連著者
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KITAGAWARA Yutaka
SEH Isobe R & D Center, Shin-Etsu Handotai Co., Ltd.
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Kitagawara Y
Shin‐etsu Handotai Co. Ltd. Gunma Jpn
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TAKENAKA Takao
SEH Isobe R & D Center, Shin-Etsu Handotai Co., Ltd.
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Kato M
Department Of Botany National Science Museum
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Radzimski Zbigniew
Department Of Materials Science And Engineering North Carolina State University:(present Address) Se
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Kitagawara Yutaka
Seh Isobe R&d Center Shin-etsu Handotai Co. Ltd.
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Oka S
Seh Isobe R&d Center Shin-etsu Handotai Co. Ltd.
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TAMATSUKA Masaro
Department of Materials Science and Engineering, North Carolina State University
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ROZGONYI George
Department of Materials Science and Engineering, North Carolina State University
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OKA Satoshi
SEH Isobe R&D Center, Shin-Etsu Handotai Co., Ltd.
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KATO Masahiro
SEH Isobe R&D Center, Shin-Etsu Handotai Co., Ltd.
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Rozgonyi George
Department Of Materials Science And Engineering North Carolina State University
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Tamatsuka Masaro
Department Of Materials Science And Engineering North Carolina State University:(present Address) Se
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Toda Masato
Seh Isobe R & D Center Shin-etsu Handotai Co. Ltd.
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OTOGAWA Takao
SEH Isobe R〓D Center, Shin-Etsu Handotai Co., Ltd.
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Otogawa Takao
Seh Isobe R&d Center Shin-etsu Handotai Co. Ltd.
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Takenaka Takao
Seh Isobe R & D Center Shin-etsu Handotai Co. Ltd.
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Takenaka Takao
Seh Isobe R&d Center Shin-etsu Handotai Co. Ltd.
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RADZIMSKI Zbigniew
SEH America, Inc.
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MAJIMA Masaki
SEH Isobe R&D Center, Shin-Etsu Handotai Co., Ltd.
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Majima Masaki
Seh Isobe R&d Center Shin-etsu Handotai Co. Ltd.
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HAYAMIZU Yoshinori
SEH Isobe R&D Center, Shin-Etsu Handotai Co., Ltd.
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HOSHI Ryoji
SEH Isobe R&D Center, Shin-Etsu Handotai Co., Ltd.
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Hoshi Ryoji
Seh Isobe R&d Center Shin-etsu Handotai Co. Ltd.
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Hayamizu Yoshinori
Seh Isobe R&d Center Shin-etsu Handotai Co. Ltd.
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速水 善範
SEH Isobe R&D Center, Shin-Etsu Handotai Co., Ltd.
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KITAGAWARA Yutaka
SEH Isobe R&D Center, Shin-Etsu Handotai Co., Ltd.
著作論文
- Study of Applicability of AC Photovoltaic Method and Photoconductive Decay Method Using Microwaves as Noncontact Methods for Bulk Lifetime Measurement
- Medium Field Breakdown Origin on Metal Oxide Semiconductor Capacitor Containing Grown-in Czochralski Silicon Crystal Defects
- Medium Field Breakdown Following Local Tunneling Current on MOS Capacitor Containing Grown-in CZ Crystal Defects
- High-sensitivity Defect Evaluation by a New Preferential Etching Technique for Highly As-doped Si Crystals
- 短波長励起室温フォトルミネッセンス法及び表面電荷分析法によるシリコンエピタキシャル層ライフタイム品質の評価〔英文〕