OTOGAWA Takao | SEH Isobe R〓D Center, Shin-Etsu Handotai Co., Ltd.
スポンサーリンク
概要
関連著者
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OTOGAWA Takao
SEH Isobe R〓D Center, Shin-Etsu Handotai Co., Ltd.
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Otogawa Takao
Seh Isobe R&d Center Shin-etsu Handotai Co. Ltd.
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ONABE Hideaki
Raytech Corporation
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Onabe H
Raytech Corp. Tochigi
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MIYACHI Takashi
Institute for Nuclear Study, University of Tokyo
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MATSUZAWA Hidemi
SEH Isobe R〓D Center, Shin-Etsu Handotai Co., Ltd.
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KOBAYASHI Norihiro
SEH Isobe R〓D Center, Shin-Etsu Handotai Co., Ltd.
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Onabe Hideaki
Raytech Corp.
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Miyachi Takashi
Institute For Nuclear Study University Of Tokyo
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Matsuzawa H
Faculty Of Engineering Yamanashi University
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Otogawa T
Shin‐etsu Handotai Co. Ltd. Gunma Jpn
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Kobayashi N
Kanazawa Univ. Kanazawa Jpn
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Miyachi T
Institute For Nuclear Study University Of Tokyo
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Ohkawa Shoichi
Institute For Nuclear Study University Of Tokyo
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Okawa S
Chiba Univ. Chiba Jpn
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IKEDA Yasuhiro
SEH Isobe R&D Center Shin-Etsu Handotai Co., Ltd.
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Ikeda Y
Seh Isobe R&d Center Shin-etsu Handotai Co. Ltd.
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KITAGAWARA Yutaka
SEH Isobe R & D Center, Shin-Etsu Handotai Co., Ltd.
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Ikeda Yoshihiro
Department Of Electrical And Electronic Engineering Tokyo Institute Of Technology
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Kitagawara Yutaka
Seh Isobe R&d Center Shin-etsu Handotai Co. Ltd.
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MAJIMA Masaki
SEH Isobe R&D Center, Shin-Etsu Handotai Co., Ltd.
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Majima Masaki
Seh Isobe R&d Center Shin-etsu Handotai Co. Ltd.
著作論文
- Position-Dependent Instability of Lithium-Drifted Silicon Detector
- Development of Lithium-Drifted Silicon Detectors Using an Automatic Lithium-Ion Drift Apparatus
- Stability of a Lithium-Drifted Silicon Detector
- Long-Term Instability of Lithium-Drifted Silicon Detector
- High-sensitivity Defect Evaluation by a New Preferential Etching Technique for Highly As-doped Si Crystals