Position-Dependent Instability of Lithium-Drifted Silicon Detector

スポンサーリンク

概要

著者

関連論文

Using X-ray energy information in CT measurement of a phantom with an Al region
Simulation Study on Unfolding Methods for Diagnostic X-rays and Mixed Gamma Rays
A Current-Mode Detector for Unfolding X-ray Energy Distribution
Energy Measurement of X-rays in Computed Tomography for Detecting Contrast Media
Resistivity Measurements of Directly Bonded Si Wafers
Low Exposure X-ray Transmission Measurements for Contrast Media Detection with Filtered X-rays
Using X-ray Energy Information in CT Measurement of a Phantom with an Al Region
Position-Dependent Instability of Lithium-Drifted Silicon Detector
Development of Lithium-Drifted Silicon Detectors Using an Automatic Lithium-Ion Drift Apparatus
Stability of a Lithium-Drifted Silicon Detector
A Thick and Large Active Area Si(Li) Detector
Light Position Sensitive Silicon Detectors Produced by Using the Epitaxial Growth Technique : II-3: SYSTEM AND ARRAY
29a-N-6 Pion Absorption in the 1 GeV/c region
Detection Technique of Negative Ions by Photodetachment in SF_6 Low-Frequency Discharge
Unfolding Method with X-ray Path Length-Dependant Response Functions for Computed Tomography Using X-ray Energy Information
Electron-Induced Cascade Shower in Lead Glass
Upper Limits of Electron Beam Currents Focusable with High-T_c Bulk Superconductor Lenses (Supertrons)
Long-Term Instability of Lithium-Drifted Silicon Detector
Unfolding Method with X-ray Path Length-Dependant Response Functions for Computed Tomography Using X-ray Energy Information
Spurious Peaks in Total Reflection X-Ray Fluorescence Analysis
Origins of Spurious Peaks of Total Reflection X-Ray Fluorescence Analysis of Si Wafers Excited by Monochromatic X-Ray Beam W-Lβ
Influence of Standing Waves on Impurity Analysis of Si(001) Wafer Using Commercially Available Total-Reflection X-Ray Fluorescence Analyzer
Main Peak Profiles of Total Reflection X-Ray Fluorescence Analysis of Si(001) Wafers Excited by Monochromatic X-Ray Beam W-Lβ(II)
Main Peak Profiles of Total Reflection X-Ray Fluorescence Analysis of Si(001) Wafers Excited by Monochromatic X-Ray Beam W-Lβ (I)
Self-Magnetic Fields of Electron Beams Confined to Bores of High-T_c Sintered Superconducting Pipes
Cascaded High-T_c Bulk Superconductor Lenses (Supertrons) for Intense Electron Beams
Experimental Corroboration for a Ferrite-Core Model of High-T_c Bulk Superconductor Lenses (Supertrons)
Flexible Adiabatic Light Guide of Silicon Rubber
Using X-ray Energy Information in CT Measurement of a Phantom with an Al Region
Total Absorption Measurements for 250-1000 MeV Photons in Carbon, Aluminium and Titanium
Photon Tagging System at the INS Electron Synchrotron
The Totel Absorption Cross Section of 250-550 MeV Photons in Carbon, Aluminium and Copper
Narrow Spacing Drift Chamber
Total Absorption Measurements for 450-1000 MeV Photons in Various Materials
Absolute Calibration of Bremsstrahlung Beam Monitors
High-sensitivity Defect Evaluation by a New Preferential Etching Technique for Highly As-doped Si Crystals
Atmosphere Effect on Migration of Co and Si in Au-Go-Si System
Advantages of Response Function Change in a transXend Detector with Various Scintillators as Substrates of Segment Detectors
Resistivity Measurements of Directly Bonded Si Wafers
Interface Resistivity of Directly Bonded Si Wafers

もっと見る

スポンサーリンク