Analysis of the Correlative Characteristics between Adjacent Pixels of Amplified Metal Oxide Semiconductor Imager by a New-Type Least Squares Method
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概要
- 論文の詳細を見る
- 社団法人応用物理学会の論文
- 1993-06-15
著者
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Imai M
Univ. Osaka Prefecture Sakai
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TANAKA Katsu
NHK Science and Technical Research Laboratories
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Taketoshi Kazuhisa
NHK Science and Technnical Research Laboratortes
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Taketoshi K
Nhk Science And Technical Research Laboratories:(present Address)department Of Electrical Engineerin
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Taketoshi Kazuhisa
Nhk Science And Technical Research Lab's
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Taketoshi Kazuhisa
Department Of Electrical And Electronic Engineering Faculty Of Engineering
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ANDOH Fumihiko
NHK Science and Technical Research Laboratories
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IMAI Masaharu
Semiconductor Technology Center, Olympus Optical Co., Ltd.
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Andoh F
Nhk Sci. And Technical Res. Lab. Tokyo Jpn.
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Andoh Fumihiko
Nhk Science And Technical Research Lab.
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