High-Resolution Electron Microscopy on Epitaxial Pb(Mg_<1/3>Nb_<2/3>)O_3 Film Prepared by Sol-Gel Method
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概要
- 論文の詳細を見る
Highly oriented Pb(Mg_<1/3>Nb_<2/3>)O_3 films prepared by the sol-gel method were studied with high resolution electron microscopy. The latteice image reveals epitaxial growth at the interface between the pervoskite crystal and MgO single crystal substrate. A Short-range orderd structure is acertained to exist in the perovskite grains in the film.
- 社団法人応用物理学会の論文
- 1991-06-01
著者
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Imai M
Univ. Osaka Prefecture Sakai
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Kakuno K
Yokohama National Univ. Yokohama
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Kakuno Keiichi
Department Of Computer Engineering Yokohama National University
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Okuwada K
Toshiba Corp. Yokohama Jpn
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Okuwada Kumi
R & D Center, Toshiba Corporation
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Nakamura Shin-ichi
R & D Center, Toshiba Corporation
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Imai Motomasa
R & D Center, Toshiba Corporation
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