Fine Structures of the X-Ray Absorption Spectra for Thin Films of Metallic Coppers
スポンサーリンク
概要
- 論文の詳細を見る
The fine structures of x-ray K absorption spectra of metallic copper for various thickness are measured by a tube spectrometer with a Geiger-Muller counter. Copper films in the range of thickness 0.15μ to 8μ are prepared by vacuum evaporation. The absorbers consist of several sheets which are cut from a thin film with a given thickness and then superimposed one upon the other to be the same thickness in all cases when several thin films with different thickness are used. Single films with various thickness are also used as absorbers. The fine structures of the absorption spectra nearly coincide with each other for various absorbers and do not show appreciable dependence upon the absorber thickness.
- 社団法人応用物理学会の論文
- 1970-11-05
著者
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Nakamori Hiroo
College Of Engineering University Of Osaka Prefecture
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Tsutsumi Kenjiro
College Of Engineering University Of Osaka Prefecture
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KUBO Hayao
College of Engineering, University of Osaka Prefecture
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Kubo Hayao
College Of Engineering University Of Osaka Prefecture
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TSUTSUMI Kenjiro
College of Engineering, University of Osaka Prefecture
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