The Effect of Plastic Deformation on the Electrical Resistivity of a Cu-4wt% Ti Alloy with Modulated Structure
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概要
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Resistivity changes during tensile deformation at 77°K and at room temperature were observed for as-quenched and annealed specimens of Cu-4wt% Ti alloy. It was found that the resistivity of each specimen usually increased during plastic deformation at 77°K, but for room temperature deformation the resistivity of the specimens annealed at 450℃ for more than 1 hour decreased with the increase in strain. The last mentioned unusual decrease in resistivity is interpreted in terms of the segregation of solute atoms to moving dislocations and the formation of solute-rich atmosphere in the matrix.
- 社団法人応用物理学会の論文
- 1970-11-05
著者
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Watanabe Ryoji
National Research Institute For Metals
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Watanabe Ryoji
Natioleal Sanatatorium
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Saito Kazuo
National Research Institute For Metals
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