Correction Devisors for the Four-Point Probe Resistivity Measurement on Cylindrical Semiconductors
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概要
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Using the Neumann function, this paper gives the expressions of the correction devisors for the equally spaced and linearly arrayed four-point probes on the same generating line of a circular cylinder of infinite length. Also for the cylinder of semi-infiniteand finite length, the effects of the non-conducting and conducting edges are considered. The correction devisors are given as the function of the ratio of the radius of the cylinder to the probe spacing with the parameter of the edge effect. Several special cases obtained using our idea coincide with other results already calculated by the method of images hitherto used.
- 社団法人応用物理学会の論文
- 1970-01-05
著者
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Kanamori Hitoshi
Department Of Electrical Engineering Kyoto Technical University
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Murashima Sadayuki
Department Of Electrical Engineering Kyoto Technical University
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ISHIBASHI Fumio
Department of Electrical Engineering, Aichi Institute of Technology
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Ishibashi Fumio
Department Of Electrical Engineering Aichi Institute Of Technology
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Kanamori Hitoshi
Department No.13 Vehicle Evaluation And Engineering Division I Vehicle Development Center 1 Toyota M
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