High-Level Test Generation for Asynchronous Circuits from Signal Transition Graph(Special Section on VLSI Design and CAD Algorithms)

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概要

• 論文の詳細を見る

• In this paper, we have proposed an efficient high-level test generation method for asynchronous circuits. The test generation is based on specification level, especially on Signal Transition Craph (STG), which is a kind of specification method for asynchronous circuits. We define a high-level fault model, called a single State Transition Fault (STF) model on STG. Test patterns for STFs are generated based on Stable State Craph (SSG), which can be derived from STG directly. The state space explored in test generation is greatly reduced and hence the test generation cost is small in terms of execution time. To enhance the fault coverage at gate-level, we have also proposed an extended STF (ESTF) model with additional gate-level information. Experimental results show that the generated test for STFs achieves high fault coverage with low cost for single stuckat faults of its corresponding synthesized gate-level circuit. The generated test for ESTFs attains higher fault coverage with same benchmark in cost of longer execution time. Further, we have also proposed a 3-phase test generation based on the above proposed methods. An effective test generation is implemented by 3-phase: 1) test generation for STFs, 2) test generation for ESTFs, and 3) test generation using an asynchronous product machine traversal method. Experimental results also show that the proposed 3-phase test generation achieves higher fault coverage in cost of longer execution time.

• 社団法人電子情報通信学会の論文
• 2002-12-01

著者

• Lee D‐i

  Gwangju Inst. Of Sci. And Technol. Kor

• Choi H‐y

  School Of Electrical & Computer Eng. Chungbuk National University

• Lee Dong-ik

  Department Of Information And Communications Gwangju Institute Of Science And Technology

• KIM Soo-Hyun

  Department of Information and Communications, Gwangju Institute of Science and Technology

• CHOI Ho-Yong

  School of Electrical & Computer Eng., Chungbuk National University

• OH Eunjung

  Department of Information and Communications, Kwang-Ju Institute of Science & Technology (K-JIST)

• Kim Soo-hyun

  Department Of Information And Communications Gwangju Institute Of Science And Technology

• Oh Eunjung

  Department Of Information And Communications Kwang-ju Institute Of Science & Technology (k-jist)

• Kim Soo-hyun

  Department Of Hospital Infection Control Korea University Hospital

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