Test Generation for SI Asynchronous Circuits with Undetectable Faults from Signal Transition Graph Specification(Special Section on Papers Selected from ITC-CSCC 2000)
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概要
- 論文の詳細を見る
In this paper, we propose an approach to test pattern generation for Speed-Independent(SI) asynchronous control circuits. Test patterns are generated based on a specified sequence, which is derived from the specification of a target circuit in the form of a Signal Transition Graph(STG). Since the sequence represents the behavior of a circuit only with stable states, the state space of the circuit can be represented as reduced one. A product machine, which consists of a fault-free circuit and a faulty circuit, is constructed and then the specified sequence is applied sequentially to the product machine. A fault is detected when the product machine produces inconsistency, i.e., output values of a fault-free circuit and a faulty circuit are different, and the sequentially applied part of the sequence becomes a test pattern to detect the fault. We also propose a test generation method using an undetectable fault identification as well as the specified sequence. Since the reduced state space is a subset of that of a gate level implementation, test patterns based on a specification cannot detect some faults. The proposed method identifies those faults with a circuit topology in advance. BDD is used to implement the proposed methods efficiently, since the proposed methods have a lot of state sets and set operations. Experimental results show that the test generation using a specification achieves high fault coverage over single stuck-at fault model for several synthesized SI circuits. The proposed test generation using a circuit topology as well as a specification decreases execution time for test generation with negligible cost retaining high fault coverage.
- 社団法人電子情報通信学会の論文
- 2001-06-01
著者
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Lee Jeong-gun
The Department Of Information And Communications Gwangju Institute Of Science And Technology
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Lee Jeong-gun
The Department Of Information And Communications Kwang-ju Institute Of Science & Technology(k-ji
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Lee D‐i
Gwangju Inst. Of Sci. And Technol. Kor
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OH Eunjung
the Department of Information and Communications, Kwang-Ju Institute of Science & Technology(K-JIST)
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LEE Dong-Ik
the Department of Information and Communications, Kwang-Ju Institute of Science & Technology(K-JIST)
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CHOI Ho-Yong
the School of Electrical & Electronics Engineering, Chungbuk National University
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Choi H‐y
School Of Electrical & Computer Eng. Chungbuk National University
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Lee Dong-ik
Department Of Information And Communications Gwangju Institute Of Science And Technology
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Lee Dong-ik
The Department Of Info.& Comm. K-jist
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Oh Eunjung
Department Of Information And Communications Kwang-ju Institute Of Science & Technology (k-jist)
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