Local Area Characterization of TTF-TCNQ Evaporated Films by Scanning Probe Microscope (Special Issue on Organic Molecular Electronics for the 21st Century)
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概要
- 論文の詳細を見る
We have developed a new type electrical probing system based on an atomic force microscope. This method enables us to measure simultaneously the surface topography and surface potential of thin films containing the crystal grains. The obtained local potential changes give an insight into conduction through the grains and their boundaries.
- 社団法人電子情報通信学会の論文
- 2000-07-25
著者
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Tanaka Kuniaki
Department Of Electronics And Mechanical Engineering Chiba University
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IIZUKA Masaaki
Chiba University
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Kudo K
Chiba Univ. Chiba Jpn
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Iizuka Masaaki
Faculty Of Education Chiba University
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Tanaka K
Department Of Material Chemistry Graduate School Of Engineering Kyoto University
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KUNIYOSHI Shigekazu
the Department of Electronics and Mechanical Engineering, Chiba University
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IIZUKA Masaaki
the Department of Electronics and Mechanical Engineering, Chiba University
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KUDO Kazuhiro
the Department of Electronics and Mechanical Engineering, Chiba University
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TANAKA Kuniaki
the Department of Electronics and Mechanical Engineering, Chiba University
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Kudo Kazuhiro
The Department Of Electrical And Electronics Engineering Chiba University
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Kuniyoshi Shigekazu
The Department Of Electronics And Mechanical Engineering Chiba University
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