MRヘッドの再生特性に及ぼす永久磁石膜形状の影響

概要

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The output fluctuations of magnetoresistive (MR) heads with abutted permanent magnets were analyzed by micromagnetic simulation. The longitudinal bias field was calculaated from the magnetization configuration of the permanent magnet (PM) film. The output fluctuation of the MR head was simulated by using the longitudinal bias field, which was calculated with various interface structures between the MR and PM films. When the PM film covered the track edge of the MR capping layer, the longitydinal bias field near the track edge was locally reduced. The local refuction of the bias field was caused by an extrafield generated by a charge appearing at the ede of the region where the PM film overlaps the capping later. It is proved that an MR gead with a PM film coveting the edge of the capping later shows output fluctuation, whereas the output is stable when the PM film does not cover the capping layer.
社団法人日本磁気学会の論文
1998-04-15