CoCrTaPt薄膜磁気記録媒体の面内の結晶学的構造と保磁力 (<特集>磁気記録媒体)

概要

論文の詳細を見る
CoCrTaPt/Cr thin-film magnetic recording media were prepared by dc magnetron sputtering onto circumferentially textured NiP/Al substrates at various substrate temperatures and substrate bias voltages. The in-plane crystallographic structure was analyzed by laboratory X-ray diffraction and grazing incidence X-ray diffraction using synchrotron radiation, and the correlation between the in-plane crystallographic structure and coerciVity was studied. The coercivity was found to depend on both the in-plane c-axis population and strain. This suggests that both magnetocrystalline anisotropy and the inverse magnetostrictive effect govern the coercivity and magnetic anisotropy. However, the in-plane crystallite size of a Co alloy layer was the same for any deposition parameters.
1997-04-15