二重露出によるX線応力測定

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There are two ways to measure stresses by means of X-rays. namely the counter method and he photographical method. There is tendency in recent years that the counter method has been gradually being employed in laboratories and factories because of its affording possibilities of easy handling and quick measuring. It is well known, however, that the photographical method has hither to been more frequently applied than the counter method to the measurement of residual, tress on local and small positions. There are several difficult problems about the measuring technique of the conventional photographical method. for example, the difficulty in powdering the specimen surface with calibrating material and the difficulty in determination of peak positition on he broadened diffraction lines, since the distance between the diffraction lines from the specimen he calibrating material is close on the film. In the present study a new method of determining X-ray stress from this point of view by the photographical method without using calibrating material has been tested and those features are mentioned. The distance between the X-ray film and the surface of specimen can be precisely determined by the diameter of diffraction ring of the calibrating material which powders the specimen surface by the conventional method. Bragg's angle of specimen is obtained by using the value of he distance and the radius of the diffraction ring of the specimen. On the other hand. by a new nethod which is called the double exposure method. the first exposure is given on the X-ray film from which the distance to the specimen is l_1, and when the distance between the specimen is set at l_2, the second diffraction ring of the specimen is photographed. Bragg's angle 2θ is calculated from Δl, the difference between the distance l_1 and the distance l_2, and Δ_r, the difference between he radius r of the diffraction rings at the first and second exposures as 2θ= tan<-1>[- (Δ_r)/(Δl_1)].
社団法人日本材料学会の論文
1969-12-15

二重露出によるX線応力測定

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