An Interferometric Study of the Shock-Reflection Process in Ionizing Krypton

スポンサーリンク

概要

• 論文の詳細を見る

• The shock reflection process in an ionizing krypton on the end wall of a shocktube has been investigated using a Mach-Zehnder interferometer technique atincident shock Mach numbers M. -12.7 with initial pressure P.=l.0Torr andequilibrium elecrton number densities n..'-10" cm '. Numerical calculationson the same process have also been made by the use of the two-step Lax-Wendroffscheme taking into account of the side wall boundary layer effect behind theincident shock. The calculated results of the interference light intensity in theionization relaxation region gave fairly good agreement with the experimentalones by use of the value of 1.2 x 10 " cm'/eV, which was obtained by Glasset al. at n.. -10" cm ', for the slope constant of excitation cross section againstrelative kinetic energy for krypton atom-atom collisions.

• 社団法人日本物理学会の論文
• 1979-04-15

著者

• Ezumi Hiromichi

  Hiroshima Denki Institute Of Technology

関連論文

• Preparation of p-Type CdS Thin Film by Laser Ablation
• Stress-Induced Raman Frequency Shift in CuInSe_2 Thin Films Prepared by Laser Ablation
• Shock-Tube Measurements of the Excitational Cross-Section in Xenon-Hydrogen Mixture
• A Two-Wavelength Interferometric Measurements of the Reflection Process in an Ionizing Shock Wave
• Atom-Atom Excitation in Shock Waves in Argon-Oxygen Mixture
• Ionization Relaxation in Shock-Heated Krypton-Argon Mixtures
• An Interferometric Study of the Shock-Reflection Process in Ionizing Krypton

スポンサーリンク