X-ray Study of Lattice Defects in Si Single Crystals by Transmission Berg-Barrett Technique

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概要

• 論文の詳細を見る
• 社団法人日本物理学会の論文
• 1960-12-05

著者

• Kohra Kazutaka

  Institute Of Physics College Of General Education University Of Tokyo

• Kohra Kazutaka

  Institute Of Applied Science Faculty Of Engineering Kyushu University

• YOSHIMATSU Mitsuru

  Rigaku Denki Co. Ltd.

• Yoshimatsu Mitsuru

  Rigaku Denki Co. Lid.

関連論文

• X-ray Study of Lattice Defects in Si Single Crystals by Transmission Berg-Barrett Technique
• On the Anomalies of the Small Angie Reflection of Cathode Rays from the Surface of a Single Crystal. : Part 3. The Effect of Absorption.
• X-ray Topographic Study on Stacking Faults in Silicon Single Crystals
• Some Observations of Imperfections in ADP Single Crystals by X-Ray Diffraction Micrography
• X-Ray Observations of Lattice Defects in Particular, Stacking Faults in the Neighbourhood of a Twin Boundary in Silicon Single Crystals
• Observations on the Polygonization of Bent LiF Crystals by the Berg-Barrent Method
• Loop Shaped Images Observed in X-Ray Diffraction Micrographs of Silicon Single Crystals
• A New Type of X-Ray Pendellosung Fringes Observed in a Parallel-Sided Quartz Single Crystal
• X-ray observations on Cleavage Faces of LiF Single Crystals

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