Some Observations of Imperfections in ADP Single Crystals by X-Ray Diffraction Micrography
スポンサーリンク
概要
- 論文の詳細を見る
Lattice defects in ADP single crystals made by the Ogawa technique are studied using the Lang method of X-ray diffraction micrography. Besides dislocations, two kinds of lattice defects are observed; one is strain extended in band shape near the surfaces and the other interfaces. The interface which is not parallel to the surfaces of parallel-sided crystals generates parallel fringes in traverse photographs which consist of two systems of hook-shaped Pendellosung fringes inside the crystals.
- 社団法人応用物理学会の論文
- 1966-01-15
著者
関連論文
- X-ray Study of Lattice Defects in Si Single Crystals by Transmission Berg-Barrett Technique
- X-ray Topographic Study on Stacking Faults in Silicon Single Crystals
- Some Observations of Imperfections in ADP Single Crystals by X-Ray Diffraction Micrography
- X-Ray Observations of Lattice Defects in Particular, Stacking Faults in the Neighbourhood of a Twin Boundary in Silicon Single Crystals
- Observations on the Polygonization of Bent LiF Crystals by the Berg-Barrent Method
- Loop Shaped Images Observed in X-Ray Diffraction Micrographs of Silicon Single Crystals
- A New Type of X-Ray Pendellosung Fringes Observed in a Parallel-Sided Quartz Single Crystal
- X-ray observations on Cleavage Faces of LiF Single Crystals