Defect Production by Electron Excitation in Cu and Ag
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概要
- 論文の詳細を見る
It has been found in ion-irradiated Cu and Ag thin foils that lattice defects are pro-duced not only through e:lastic collisions, bvxt also throxagh a process strongly associ-ated with electronic stopping power .s'.. In 'the latter process, the defect productioncross section is proportional to .5J" in Ctt and .5J" in Ag. The nearly quadraticdependence of the defect production cross section on .s'. suggests that the mutualCoulomb repulsion of ions positively charged by electron excitation causes the defectproduction in Cu and .Ag.[defect production, electron excitation, copper and silver, ion irradiation, l] mutual Coulomb reptulsion of positive Tonsl
- 社団法人日本物理学会の論文
- 1992-11-15
著者
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IWATA Tadao
Aduanced Satence Rctcarch Ocean,Japan Atomic Energy Resaech Institute
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Iwata T
Aduanced Satence Rctcarch Ocean Japan Atomic Energy Resaech Institute
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Iwata Tadao
Department Of Physics Japan Atomic Energy Research Institute
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Iwase A
Japan Atomic Energy Res. Inst. (jaeri) Ibaraki
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Iwase Akihiro
Department Of Materials Science Japan Atomic Energy Research Institute (jaeri)
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NIHIRA Takeshi
Faculty of Engineering,Ibaraki University
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IWATA Takao
College of General Education,Tohoku University
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Iwata Takao
College Of General Education Tohoku University
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Nihira T
Faculty Of Engineering Ibaraki University
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Nihira Takeshi
Faculty Of Engineering Ibaraki University
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