トランケート面評価のための表面おうとつ形状のリロケーションに関する研究(第2報) : 2次元断面曲面の統計情報に基づいた方法

概要

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Evaluation of truncated surface asperities is critically important in many industrial applications. It is necessary to compare original profile with truncated one in a discussion of truncation process, i.e. wear mechanism and plateau horning etc. For the comparison of profiles, we have to relocate truncated profile to original one. But there is a limitation of relocation using a hardware. To relocate accurately, we suggest a relocation technique using software. In this paper, we present a new relocation technique by corresponding untruncated areas between truncated profile and original one by software. We calculate probability distributions of two profile's heights and relocate profile to collate them. Furthermore, we discuss the availability of this technique in simulation data and measured one.
公益社団法人精密工学会の論文
1999-03-05