<Abstract>Epitaxial Growth of GaN on Si(111) Substrate using AlN Intermediate Layer
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概要
著者
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Davydov V.
Ioffe Physico-technical Institute Russian Academy Of Sciences
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INUSHIMA Takashi
Department of Communications Engineering
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YOKOYAMA Atsushi
Course of Electrical Engineering, Tokai University
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Yokoyama Atsushi
Course Of Electrical Engineering Tokai University
関連論文
- Fabrication of AlN/Al_2O_3 GHz Band SAW Filter and Simulation Analysis
- Fabrication of Al_In_xN films at the Resonance point of Nitrogen-ECR plasma
- Crystal Morphology and Electrical Properties of AlN Grown on 6H-SiC
- Co-existence of semiconducting and superconducting properties of InN(ABSTRACTS OF PROCEEDINGS OF THE SCHOOL OF INFORMATION TECHNOLOGY AND ELECTRONICS SERIES J TOKAI UNIVERSITY -2003-2004-)
- Epitaxial Growth of GaN on Si(111) Substrate using AlN Intermediate Layer
- In-situ Monitoring of AlN Crystal Growth on 6H-SiC by the use of Pyrometer(ABSTRACTS OF PROCEEDINGS OF THE SCHOOL OF INFORMATION TECHNOLOGY AND ELECTRONICS SERIES J TOKAI UNIVERSITY -2003-2004-)
- Superconducting Properties of InN with Low Carrier Density near the Mott Transition