Generation and Controlling the Trap in Absorbent Germanium Oxide Film
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概要
- 論文の詳細を見る
- 2011-08-25
著者
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Ueno Tomo
Department Of Electrical And Electronic Engineering Tokyo University Of Agriculture And Technology
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Oniki Yusuke
Department Of Electronic Information Engineering Tokyo University Of Agriculture And Technology
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Ueno Tomo
Department Of Electronic Information Engineering Tokyo University Of Agriculture And Technology
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Oniki Yusuke
Department of Electronic and Electrical Engineering, Tokyo University of Agriculture and Technology, Koganei, Tokyo 184-8588, Japan
関連論文
- Generation and Controlling the Trap in Absorbent Germanium Oxide Film
- Generation and Controlling the Trap in Absorbent Germanium Oxide Film
- HfO2/Si and HfSiO/Si Structures Fabricated by Oxidation of Metal Thin Films
- Thermal Stability of HfO2 Films Fabricated by Metal Organic Chemical Vapor Deposition
- Novel Fabrication Process for HfO2 Thin Film for Gate Dielectric
- Low-Temperature Fabrication of Ultrathin ZrO2/Si Structure Using Metal Deposition Followed by Oxygen Annealing
- Water-Related Hole Traps at Thermally Grown GeO2--Ge Interface