A High-Throughput On-Chip Variation Monitoring Circuit for MOSFET Threshold Voltage Using VCDL and Time-to-Digital Converter

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概要

• 論文の詳細を見る
• 2010-08-01

著者

• LEE Jae-seung

  Pohang University of Science and Technology (POSTECH)

• SIM Jae-Yoon

  Pohang University of Science and Technology (POSTECH)

• PARK Hong

  Pohang University of Science and Technology (POSTECH)

関連論文

• A High-Throughput On-Chip Variation Monitoring Circuit for MOSFET Threshold Voltage Using VCDL and Time-to-Digital Converter
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• A High-Throughput On-Chip Variation Monitoring Circuit for MOSFET Threshold Voltage Using VCDL and Time-to-Digital Converter
• An Analysis and Design Methodology of Resistor-Based Phase Error Averaging for Multiphase Generation

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