Investigation of Adjustable Current-Voltage Characteristics and Hysteresis Phenomena for Multiple-Peak Negative Differential Resistance Circuit
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概要
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A multiple-peak negative differential resistance (NDR) circuit made of standard Si-based metal-oxide-semiconductor field-effect-transistor (MOS) and SiGe-based heterojunction bipolar transistor (HBT) is demonstrated. We can obtain a three-peak I-V curve by connecting three cascoded MOS-HBT-NDR circuits by suitably designing the MOS parameters. This novel three-peak NDR circuit possesses the adjustable current-voltage characteristics and high peak-to-valley current ratio (PVCR). We can adjust the PVCR values to be as high as 11.5, 6.5, and 10.3 for three peaks, respectively. Because the NDR circuit is a very strong nonlinear element, we discuss the extrinsic hysteresis phenomena in this multiple-peak NDR circuit. The effect of series resistance on hysteresis phenomena is also investigated. Our design and fabrication of the NDR circuit is based on the standard 0.35μm SiGe BiCMOS process.
- (社)電子情報通信学会の論文
- 2010-04-01
著者
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GAN Kwang-Jow
Department of Electrical Engineering, National Cheng Kung University
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Gan Kwang-jow
Department Of Electrical Engineering National Chiayi University
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LIANG Dong-Shong
Department of Electrical Engineering, National Cheng Kung University
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Liang Dong-shong
Department Of Electronic Engineering Kun Shan University
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