Passivation Effect for the Reduction of $1/\aku f$ Noise in Poly(3,4-ethylenedioxythiophene):Poly(styrene sulfonate) Thin Films Based on Uncooled Type Microbolometer Applications
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概要
- 論文の詳細を見る
In this study, resistance fluctuation or $1/\aku f$ noise was measured in thin films of poly(3,4-ethylenedioxythiophene):poly(styrene sulfonate) (PEDOT:PSS). The $1/\aku f$ noise of thin films is much larger than what is typical uncooled type microbolometer sensing material such as vanadium oxide films and amorphous silicon films. To use PEDOT:PSS thin films for a bolometric application, the $1/\aku f$ noise should be reduced. This study discusses the effect of passivation for reducing the $1/\aku f$ noise.
- Japan Society of Applied Physicsの論文
- 2009-04-25
著者
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Lee Hee
Dept. Of Eecs Korea Advanced Institute Of Science And Technology:national Nanofab Center
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Lee Hee
School Of Electrical Engineering And Computer Sciences Korea Advanced Institute Of Science And Techn
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Lee Hee
School Of Electrical Engineering And Computer Science Division Of Electrical Engineering Korea Advan
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Kwon Il
School Of Electrical Engineering And Computer Sciences Korea Advanced Institute Of Science And Techn
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Son Hyeok
School Of Electrical Engineering And Computer Sciences Korea Advanced Institute Of Science And Techn
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Lee Hee
School Of Electrical Engineering And Computer Sciences Korea Advanced Institute Of Science And Techn
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