A Comprehensive Modeling Study of Two-Dimensional Silicon Subbands Using a Full-Zone k.p Method
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概要
- 論文の詳細を見る
- 2007-09-19
著者
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SKOTNICKI T.
STMicroelectronics
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BOEUF F.
STMicroelectronics
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SKOTNICKI T.
ST Microelectronics
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PAYET F.
STMicroelectronics
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SZCZAP M.
STMicroelectronics
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CAVASSILAS N.
L2MP
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MICHELINI F.
L2MP
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