Pt Buried Gate E-pHEMT with High V_<G.ON> and Reduced Surface Trap Effects
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概要
- 論文の詳細を見る
- 2006-09-13
著者
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KIM Sungwon
Seoul National Univ., School of Electrical Eng.
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JANG Kyoungchul
Seoul National Univ., School of Electrical Eng.
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HER Jincherl
Seoul National Univ., School of Electrical Eng.
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SEO Kwangseok
Seoul National Univ., School of Electrical Eng.
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SEOL Gyungseon
Seoul National Univ., School Of Electrical Engineering and Computer Science
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LEE Jaehak
Theleds Co., LTD.
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Lee Jaehak
Theleds Co. Ltd.
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Kim Sungwon
Seoul National Univ. School Of Electrical Eng.
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Seo Kwangseok
Seoul National Univ. School Of Electrical Engineering And Computer Science
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Seo Kwangseok
Seoul National Univ. School Of Electrical Eng.
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Jang Kyoungchul
Seoul National Univ. School Of Electrical Engineering And Computer Science
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Her Jincherl
Seoul National Univ. School Of Electrical Engineering And Computer Science
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Kim Sungwon
Seoul National Univ. School Of Electrical Engineering And Computer Science
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Seol Gyungseon
Seoul National Univ. School Of Electrical Engineering And Computer Science
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Lee Jinsik
Seoul National Univ. School Of Electrical Eng.
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