Evaluations of Scaling Properties for GOI MOSFETs in Nano-Scale
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概要
- 論文の詳細を見る
- 2004-09-15
著者
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Wang Y.
Institute Of Microelectronics
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KANG J.
Institute of Microelectronics, Peking University
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Du G.
Institute Of Microelectronics Peking University
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XIA Z.
Institute of Microelectronics, Peking University
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HAN R.
Institute of Microelectronics, Peking University
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LIU X.
Institute of Microelectronics, Peking University
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HOU D.
Institute of Microelectronics, Peking University
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Han R.
Institute Of Microelectronics Peking University
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Xia Z.
Institute Of Microelectronics Peking University
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Kang J.
Institute Of Microelectronics Peking University
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Liu X.
Institute Of Microelectronics Peking University
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Wang Y.
Institute Of Materials Science And Engineering ; Center For Nanoscience And Nanotechnology National
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Du G.
Institute Of Geotechnical Engineering Southeast University
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