Non-linear Distortion Caused by the Electrical Memory Effect and its Dependence on the Circuit Parameters of a GaAs MESFET Amplifier

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概要

• 論文の詳細を見る
• 2003-11-18

著者

• TAKANO Takeshi

  Fujitsu Laboratories Ltd.

• DAIDO Yoshimasa

  Kanazawa Institute of Technology

• ARAKI Kiyomichi

  Tokyo Institute of Technology

• Maniwa Toru

  Fujitsu Laboratories Ltd., YRP R & D Center

• Araki Kiyomichi

  Tokyo Inst. Of Technol. Tokyo Jpn

• Maniwa Toru

  Fujitsu Laboratories

• Araki K

  Graduate School Of Engineering Tokyo Institute Of Technology

• Araki K

  Saitama Univ. Uarawa‐shi Jpn

• Araki Kiyomichi

  The Department Of Computer Science Tokyo Institute Of Technology

• OISHI Yasuyuki

  Fujitsu Laboratories

• Takano Takeshi

  Fujitsu Laboratories

• Daido Y

  Kanazawa Institute Of Technology

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