Non-linear Distortion Caused by the Electrical Memory Effect and its Dependence on the Circuit Parameters of a GaAs MESFET Amplifier
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概要
- 論文の詳細を見る
- 2003-11-18
著者
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TAKANO Takeshi
Fujitsu Laboratories Ltd.
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DAIDO Yoshimasa
Kanazawa Institute of Technology
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ARAKI Kiyomichi
Tokyo Institute of Technology
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Maniwa Toru
Fujitsu Laboratories Ltd., YRP R & D Center
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Araki Kiyomichi
Tokyo Inst. Of Technol. Tokyo Jpn
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Maniwa Toru
Fujitsu Laboratories
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Araki K
Graduate School Of Engineering Tokyo Institute Of Technology
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Araki K
Saitama Univ. Uarawa‐shi Jpn
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Araki Kiyomichi
The Department Of Computer Science Tokyo Institute Of Technology
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OISHI Yasuyuki
Fujitsu Laboratories
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Takano Takeshi
Fujitsu Laboratories
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Daido Y
Kanazawa Institute Of Technology
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