Takano Takeshi | Fujitsu Laboratories

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著作論文

Influence of Frequency Characteristics of RF Circuits in Digital Predistortion Type Linearizer System on Adjacent Channel Leakage Ratio for W-CDMA Power Amplifier(Analog Circuit Techniques and Related Topics)
Non-linear Distortion Caused by the Electrical Memory Effect and its Dependence on the Circuit Parameters of a GaAs MESFET Amplifier
Non-linear Distortion Caused by the Electrical Memory Effect and its Dependence on the Circuit Parameters of a GaAs MESFET Amplifier
Non-linear Distortion Caused by the Electrical Memory Effect and its Dependence on the Circuit Parameters of a GaAs MESFET Amplifier
Non-linear Distortion Caused by the Electrical Memory Effect and its Dependence on the Circuit Parameters of a GaAs MESFET Amplifier
Efficient Method to Measure IMD of Power Amplifier with Simplified Phase Determination Procedure to Clarify Memory Effect Origins
Iterative Determination of Phase Reference in IMD Measurement to Characterize Nonlinear Behavior, and to Derive Inverse, for Power Amplifier with Memory Effect
Design of Predistorter with Efficient Updating Algorithm of Power Amplifier with Memory Effect

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