Dielectric Properties and Leakage Current Characterization of the Ba(Sn_xTi_<1-x>)O_3 Thin Films Prepared by Radio Frequency Magnetron Sputtering
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概要
- 論文の詳細を見る
- 2006-09-15
著者
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Lin Huey-jiuan
Department Of Materials Science And Engineering National United University
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Wang Moo-chin
Faculty Of Fragrance And Cosmetics Kaohsiung Medical University
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Huang Hong-hsin
Department Of Electrical Engineering Cheng Shiu University
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CHEN Chung-Yuan
Department of Materials Science and Engineering, National Cheng Kung University
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WU Nan-Chung
Department of Materials Science and Engineering, National Cheng Kung University
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Wu Nan-chung
Department Of Materials Science And Engineering National Cheng Kung University
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Chen Chung-yuan
Department Of Materials Science And Engineering National Cheng Kung University
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- Dielectric Properties and Leakage Current Characterization of the Ba(Sn_xTi_)O_3 Thin Films Prepared by Radio Frequency Magnetron Sputtering
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