Anisotropy of Resonant Inelastic X-ray Scattering at the K Edge of Si : Theoretical Analysis(Condensed matter : Electronic Structure, Electrical, Magnetic and Optical Properties)

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概要

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• We investigate theoretically the resonant inelastic X-ray scattering (RIXS) at the K edge of Si on the basis of an ab initio calculation. We calculate the RIXS spectra with systematically varying transfered-momenta, incident-photon energy and incident-photon polarization. We confirm the anisotropy of the experimental spectra by Y. Ma et al. [Phys. Rev. Lett. 74 (1995) 478], providing a quantitative explanation of the spectra.

• 社団法人日本物理学会の論文
• 2004-11-15

著者

• IGARASHI Jun-ichi

  Faculty of Science, Ibaraki University

• Igarashi Jun-ichi

  Department Of Systems Engineering Faculty Of Engineering Ibaraki University

• NISIKAWA Yunori

  Synchrotron Radiation Research Center, Japan Atomic Energy Research Institute

• Nisikawa Y

  Japan Atomic Energy Res. Inst. Hyogo

• Igarashi Jun-ichi

  Faculty Of Engineering Gunma University

• Nisikawa Yunori

  Synchrotoron Radiation Research Center Japan Atomic Energy Research Institute

• Usuda M

  Japan Atomic Energy Res. Inst. Hyogo Jpn

• Usuda Manabu

  Synchrotron Radiation Research Center Japan Atomic Energy Research Institute

• Usuda Manabu

  Synchrotoron Radiation Research Center Japan Atomic Energy Research Institute

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