Anneal-Induced Degradation of Amorphous Selenium Characterized by Photoconductivity Measurements
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概要
- 論文の詳細を見る
- Japan Society of Applied Physicsの論文
- 2005-03-10
著者
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OONUKI Kousuke
Department of High Energy Astrophysics, Institute of Space and Astronautical Science (ISAS), Japan A
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Butler Tim
Engineering Dept. University Of Cambridge
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OKANO Ken
Department of Electronics, Faculty of Engineering, Tokai University
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Yamada Takatoshi
Diamond Research Center National Institute Of Advanced Industrial Science And Technology (aist)
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Yamada Takatoshi
Diamond Research Center National Institute Of Advanced Industrial Science And Technology
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Yamada Takatoshi
Diamond Research Center Advanced Industrial Science And Technology
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Milne William
Engineering Dept. University Of Cambridge
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Okano Ken
Department Of Physics International Christian University
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Okano Ken
Department Of Electronic & Photonics System Engineering Kouchi University Of Technology
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Amaratunga Gehan
Engineering Dept. University Of Cambridge
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Oonuki Kousuke
Department Of Physics International Christian University
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SAITO Ichitaro
Department of Engineering, University of Cambridge
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AONO Masami
Department of Materials Science and Engineering, National Defense Academy
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BUTLER Tim
Department of Engineering, University of Cambridge
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RUPESINGHE Nalin
Department of Engineering, University of Cambridge
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AMARATUNGA Gehan
Department of Engineering, University of Cambridge
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MILNE William
Department of Engineering, University of Cambridge
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RUPESINGHE Nalin
Engineering Dept. University of Cambridge
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Aono Masami
Department Of Materials Science And Engineering National Defense Academy
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Saito Ichitaro
Department Of Physics International Christian University
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