Activated Kinetics of Room-Temperature-Deposited SrTiO_3 Thin Films Investigated by Reflection-High-Energy-Electron-Diffraction-Monitored Annealing at Different Heating Rates
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概要
- 論文の詳細を見る
- 2005-02-15
著者
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Uen Tseng-ming
Department Of Electrophysics National Chiao Tung University
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Wu Kaung-hsiung
Department Of Electrophysics National Chiao Tung University
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JUANG Jenh-Yih
Department of Electrophysics, National Chiao Tung University
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Gou Yih-shun
Department Of Electrophysics National Chiao-tung University
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Uen T‐m
Department Of Electrophysics National Chiao-tung University
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Uen Tzeng-ming
Department Of Electrophysics National Chiao-tung University
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WANG Te-Chun
Department of Electrophysics, National Chiao-Tung University
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LEE Jung-Yuee
Department of Electrophysics, National Chiao-Tung University
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HSIEH Chih-Chang
Department of Electrophysics, National Chiao-Tung University
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- Thermally Activated Diffusion Observed by In situ Reflection High Energy Electron Diffraction Intensity Monitoring on Interrupted SrTiO3 Homoepitaxial Growth
- Activated Kinetics of Room-Temperature-Deposited SrTiO3 Thin Films Investigated by Reflection-High-Energy-Electron-Diffraction-Monitored Annealing at Different Heating Rates