Influence of the image quality deterioration of a tilted thick specimen on electron tomography
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概要
- 論文の詳細を見る
- 2004-12-01
著者
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Zhang Hai-bo
Department Of Electronic Science And Technology Xi'an Jiaotong University
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Takaoka A
Osaka Univ. Ibaraki Jpn
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Takaoka Akio
Research Center For Ultra-high Voltage Electron Microscopy Osaka University
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Takaoka Akio
Research Center For Ultrahigh Voltage Electron Microscopy Osaka University
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Yang Chao
Department Of Electronic Science And Technology Xi'an Jiaotong University
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Yang Chao
Department Of Chemistry University Of Science And Technology Of China
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Takaoka Akio
Research Center For Uhvem Osaka Univ.
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Zhang Hai-bo
Department Of Electronic Science And Technology And Key Laboratory For Physical Electronics And Devi
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