Collection Efficiency of Metallic Contaminants on Si Wafer by Vapor-Phase Decomposition-Droplet Collection
スポンサーリンク
概要
著者
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Lee S‐h
Department Of Chemistry Kyungpook National University
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Kim Young-hun
R & D Center Lg Siltron Inc.
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Yoo H‐d
R&d Center Lg Siltron Inc.
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Lee Sang-hak
Department Of Chemistry Kyungpook National University
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Lee Bo-young
R&d Center Lg Siltron Inc.
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Kim Y‐h
R & D Center Lg Siltron Inc.
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KIM Young-Hun
R&D Center, LG Siltron Inc.
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LEE Bo-Young
R&D Center, LG Siltron Inc.
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Yoo Hak-Do
R&D Center, LG Siltron Inc.
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CHUNG Hye-Young
R&D Center, LG Siltron Inc
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CHO Hyo-Yong
R&D Center, LG Siltron Inc
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Chung Hye-young
R & D Center Lg Siltron Inc.
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Kim Young-Hum
R&D Center, LG Siltron Inc
関連論文
- Effects of Surface Roughness and Copper Contamination on the Oxide Breakdown of Silicon Wafer(Semiconductors)
- Observation of Micro-Oxygen Precipitates in the Vicinity of the Oxidation-Induced Stacking Fault Ring and Their Effects on Thin Gate Oxide Breakdown : Semiconductors
- Collection Efficiency of Metallic Contaminants on Si Wafer by Vapor-Phase Decomposition-Droplet Collection
- Gate-Oxide-Integrity Characteristics of Vacancy-rich Wafer Compared with Crystal-Orginated-Pits-free Wafer as a Function of Oxide Thickness
- Determination of Metallic Impurities in a Silicon Wafer by Local Etching and Electrothermal Atomic Absorption Spectrometry
- Physico-Chemical Characterization of Na_3Zr_2Si_2PO_ Fine Powders Prepared by Sol-Get Method Using Citrates
- Determination of Flow Pattern Defect Area by μ-Photoconductivity Decay Lifetime Measurement
- Behavior of Thermally Induced Defects in Heavily Boron-Doped Silicon Crystals