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Sii Nano Technology Inc. | 論文
- Development of a TES Microcalorimeter for Spectroscopic Measurement of LX-rays Emitted by Transuranium Elements
- Transition Edge Sensor-Energy Dispersive Spectrometer (TES-EDS) and Its Applications
- MICROCALORIMETER ENERGY-DISPERSIVE X-RAY SPECTROMETRY OF CLAY MINERALS BY TRANSMISSION ELECTRON MICROSCOPE
- 3P-086 バクテリオロドプシンに対するフォースカーブ測定のための細胞質側と細胞外側の識別(膜蛋白質,第47回日本生物物理学会年会)
- Fabrication of Nanomanipulator with SiO_2/DLC Heterostructure by Focused-Ion-Beam Chemical Vapor Deposition
- Transition Edge Sensor-Energy Dispersive Spectrometer (TES-EDS) and Its Applications
- In-situ Observation of the Three-Dimensional Nano-Structure Growth on Focused-Ion-Beam Chemical Vapor Deposition by Scanning Electron Microscope
- X-ray Microanalysis of Biological Samples by High-resolution Energy Dispersive Microcalorimeter Spectrometer Using a Low-voltage Scanning Electron Microscope
- Evaluation of Vacuum Microcapsule Fabricated using Focused-Ion-Beam Chemical-Vapor-Deposition
- Fabrication of Diamond-Like Carbon Nanosprings by Focused-Ion-Beam Chemical Vapor Deposition and Evaluation of Their Mechanical Characteristics(Micro/Nano Fabrication,Microoptomechatronics)
- Comparison of Young's Modulus Dependency on Beam Accelerating Voltage between Electron-Beam- and Focused Ion-Beam-Induced Chemical Vapor Deposition Pillars
- Frequency Domain Multiplexing of TES Signals by Magnetic Field Summation( Superconducting High-frequency Devices)
- Evaluation of Field Electron Emitter Fabricated Using Focused-Ion-Beam Chemical Vapor Deposition
- Development of Integrated Direct Current Superconducting Quantum Interference Device Gradiometer for Nondestructive Evaluation
- Digestion of Plastic Materials for the Determination of Toxic Metals with a Microwave Oven for Household Use
- Preparation and Certification of the New Reference Materials ; Plastics (Disk Form, JSAC 0621-0625) for Determination of Mercury Using X-Ray Fluorescent Analysis
- Nondestructive Magnetic Detection of Plasticized Area Using Superconducting Quantum Interference Device
- Surface Morphology of Diamond-Like Carbon Film and Si Wafer Milled with 30 keV Gallium Focused Ion Beam
- Deposition Yield and Physical Properties of Carbon Films Deposited by Focused-Ion-Beam Chemical Vapor Deposition
- Nanostructure Analysis of Nanosprings Fabricated by Focused-Ion-Beam Chemical Vapor Deposition