スポンサーリンク
Semiconductor Group, Mitsubishi Electric Corporation | 論文
- A Sub 1-V L-Band Low Noise Amplifier SOI CMOS(Special Section on Analog Circuit Techniques and Related Topics)
- Features of SOI DRAM's and their Potential for Low-Voltage and/or Giga-Bit Scale DRAM's (Special Issue on ULSI Memory Technology)
- Microscopic Analysis of the Degradation Mechanism of Gallium Arsenide Metal-Semiconductor Field-Effect Transistor
- Light Emission and Surface States Annealing on GaAs Metal Semiconductor Field-Effect Transistor
- Decrease in Surface States on GaAs Metal-Semiconductor Field-Effect Transistor by High Temperature Operation
- Investigation of Substrate-dependent Characteristics of SnO_2 Thin Films with Hall Effect, X-Ray Diffraction, X-Ray Photoelectron Spectroscopy and Atomic Force Microscopy Measurements
- Emerging Memory Solutions for Graphics Applications
- A Well-Synchronized Sensing/Equalizing Method for Sub-1.0-V Operating Advanced DRAM's (Special Section on the 1993 VLSI Circuits Symposium (Joint Issue with the IEEE Journal of Solid-State Circuits, Vol.29, No.4 April 1994))
- A Smart Design Methodology with Distributed Extra Gate-Arrays for Advanced ULSI Memories (Special Issue on LSI Memories)