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Sanyo Electric Co. Ltd. Gifu Jpn | 論文
- Mechanisms of Electrical Stress-Induced Degradation in H_2/Plasma Hydrogenated n- and p-Channel Polysilicon Thin Film Transistors
- Detection of Particles on Quarter μm Thick or Thinner SOI Wafers
- Detection of Particles on Quarter um Thick or Thinner SOI Wafers
- High-Density Video Disc Using Superresolution and Green Laser
- A 40GHz f_T SATURN Transistor Using 2-Step Epitaxial Base Technology (Special Issue on Ultra-High-Speed LSIs)
- Faraday Effect Due to Excitons in Cd_ Mn_x Te Films
- Rewritable Near-Field Optical Recording on Photochromic Perinaphthothioindigo Thin Films : Readout by Fluorescence
- Heavy Metal(Cu/Fe/Ni) Behavior in Ultra thin Bonded SOI Wafers Evaluated by Using Radioactive Isotope Tracers
- A New Evaluation Method of Silicon Wafer Bonding Interfaces and Bondinug Strength by KOH Etching
- Study on Electrically Plastic Devices Made with Electropolymerized Films
- Polysilicon Thin-Film Transistors Processed at Low Temperature (≦ 600℃) Using Solid-Phase Crystallization in Wet Oxygen Atmosphere