スポンサーリンク
National Tsing Hua Univ. Hsinchu Twn | 論文
- Effect of Temperature and Illumination on the Instability of a-Si:H Thin-Film Transistors under AC Gate Bias Stress : Semiconductors
- Turnaround Phenomenon of Threshold Voltage Shifts in Amorphous Silicon Thin Film Transistors under Negative Bias Stress
- The Instability Mechanisms of Hydrogenated Amorphous Silicon Thin Film Transistors under AC Bias Stress
- The Instability Characteristics of Amorphous Silicon Thin Film Transistors with Various Interfacial and Bulk Defect States
- Plasma Passivation Effects on Polycrystalline Silicon Thin-Film Transistors Utilizing Nitrous Oxide Plasma
- Growth and field emission characteristics of carbon nanotubes using Co/Cr/Al multilayer catalyst
- Characterizing Optical Properties of Self-Assembled Gold Nanoparticles for Surface Plasmon Resonance Device Applications
- Environmental cell thinning of advanced liquid crystal displays
- Antiferromagnetic Ordering in the Ternary Rare Earth Cobalt Borides RCo_4B_4(R=Ce, Gd, Tb, Dy, Ho, Er, Tm, Lu) : II. LOW TEMPERATURE PROPERTIES OF SOLIDS : Magnetism : Rare Earth etc.
- Bulk superconductivity in the New Orthorhombic (Tl, Pb)-Ca-Sr-Cu-O System : Electrical Properties of Condensed Matter
- Formation of High-T_c YBa_2Cu_3O_ Films on Y_2BaCuO_5 Substrate : Electrical Properties of Condensed Matter
- Anomalous Ferromagnetism in the Dense Kondo System Ce(Rh_Co_x)_3B_2 : II. LOW TEMPERATURE PROPERTIES OF SOLIDS : Heavy Electrons : Experiments
- Effects of a Metal Film and Prism Dielectric on Properties of Surface Plasmon Resonance in a Multilayer System
- The Influence of Metal Film Thickness on Wave Properties of Surface Plasma Waves
- Coercivity Mechanism and Microstructure Study of Sputtered Nd-Fe-B/XA/Si(111) (X = W, PI) Films
- Magnetic Properties and Growth Behavior of Nd-Fe-B Films on Si(111)
- Reduction of Plasma Etching Induced Electrical Degradation in Metal-Oxide-Si Capacitors by Furnace Grown Oxides Rapid Thermal Annealed in N_2O
- Frame-Based Worst-Case Weighted Fair Queueing with Jitter Control
- Hot Carrier Degradation in Deep Sub-Micron Nitride Spacer Lightly Doped Drain N-Channel Metal-Oxide-Semiconductor Transistors
- Deposition and Characterization of Ferroelectric Pb[(Mg_Nb_)_xTi_]0_3 Thin Films by RF Magnetron Sputtering