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Nara Institute Of Science And Technology (naist) | 論文
- A Memory Grouping Method for Reducing Memory BIST Logic of System-on-Chips(Dependable Computing)
- Effect of BIST Pretest on IC Defect Level(Dependable Computing)
- Defect Level vs. Yield and Fault Coverage in the Presence of an Unreliable BIST(Dependable Computing)
- Orbital Angular Momentum of Iron Valence Band Electron Deduced by Photoelectron Stereography(Atomic and molecular physics)
- Site-Specific Orbital Angular Momentum Analysis of Graphite Valence Electron Using Photoelectron Forward Focusing Peaks(Condensed matter: electronic structure and electrical, magnetic, and optical properties)
- Scanning Tunneling Microscopy Observation of Germapericycline on a Graphite Surface
- Test Scheduling for Multi-Clock Domain SoCs under Power Constraint
- Design and Optimization of Transparency-Based TAM for SoC Test
- 27pPSA-24 LEED and RHEED structure analysis of iron silicide 2x2 phase on Si(111)
- Transition metal catalyzed manipulation of non-polar carbon–hydrogen bonds for synthetic purpose
- Non-scan Design for Single-Port-Change Delay Fault Testability
- Validating Safety for the Integrated Services of the Home Network System Using JML