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Musashi Works Of Hitachi Ltd. | 論文
- Dependence of Warpage of Czochralski-Grown Silicon Wafers on Oxygen Concentration and Its Application to MOS Image-Sensor Device
- A Defect Control Technique for the Intrinsic Gettering in Silicon Device Processing
- Effects of Various Doping Elements on the Transition Temperature of Vanadium Oxide Semiconductors
- Thermal Warping of Large Diameter Czochralski-Grown Silicon Wafers : Semiconductors and Semiconductor Devices
- Warpage of Czochralski-Grown Silicon Wafers as Affected by Oxygen Precipitation
- Self-Isolated Transistor Structures of Bipolar Integrated Circuits