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Integrated Research Institute Tokyo Institute Of Technology | 論文
- Wide-band, high linear low noise amplifier design in 0.18um CMOS technology
- Am/Eu Separation with a New Ligand, N,N,N',N'-tetrakis((4-butoxypyridin-2-yl)methyl)ethylenediamine (TBPEN), a Hydrophobic Derivative of TPEN
- A Novel Double-Pulse Laser Plasma Spectroscopic Technique for H Analysis in Metal Samples Utilizing Transversely Excited Atmospheric-Pressure CO_2 Laser-Induced Metastable He Atoms
- Polarization anisotropy of spontaneous emission spectra in GaInAsP/InP quantum-wire structures
- GaInAsP/InP Long Wavelength Quantum-Wire Lasers
- [Invited]GaInAsP/InP Long Wavelength Quantum-Wire Lasers
- Room Temperature-Copntinuous Wave Operation of GaInAsP/InP Multiple-Quantum-Wire Lasers by Dry Etching and Regrowth Method
- New Joint Design for Enhancement of Mobility of Spacesuits for Planetary Exploration
- Variable RF Inductor on Si CMOS Chip
- 423 Performance Evaluation of an Advanced Three-Bed Mass Recovery Adsorption Refrigeration Cycle(International Session)
- A Universal Equivalent Circuit Model for Ceramic Capacitors
- Layout-Aware Compact Model of MOSFET Characteristics Variations Induced by STI Stress
- C-12-43 CMOS Power Amplifier in 65nm Technology
- C-12-37 CMOS Inverter-based Wideband LNA in 65nm Technology
- Hydrogen Analysis Using Laser Plasma Induced by TEA CO_2 Laser(量子光学,非線形光学,超高速現象,レーザ基礎,及び一般)
- An Evaluation Method of the Number of Monte Carlo STA Trials for Statistical Path Delay Analysis
- Analytical Estimation of Path-Delay Variation for Multi-Threshold CMOS Circuits
- 2-Port Modeling Technique for Surface-Mount Passive Components Using Partial Inductance Concept
- A Time-Slicing Ring Oscillator for Capturing Time-Dependent Delay Degradation and Power Supply Voltage Fluctuation
- One-Shot Voltage-Measurement Circuit Utilizing Process Variation
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