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Feram Development Alliance Semiconductor Company Toshiba Corp. | 論文
- Lead Content Control in (Pb, La) (Zr, Ti)O_3 Films Using Ar/O_2 Sequential Rapid Thermal Process
- Novel Pb(Ti,Zr)O_3(PZT) Crystallization Technique Using Flash Lamp for Ferroelectric RAM (FeRAM) Embedded LSIs and One Transistor Type FeRAM Devices
- Novel PZT Crystallization Technique by Using Flash Lamp for FeRAM Embedded LSIs and 1Tr FeRAM Devices
- Analysis of Si-Ge Source Structure in 0.15 μm SOI MOSFETs Using Two-Dimensional Device Simulation
- Analysis of Si-Ge Source Structure in 0.15μm SOI MOSFETs Using Two-Dimensional Device Simulation
- Ferroelectric Properties of Pb(Zi, Ti)O_3 Capacitor with Thin SrRuO_3 Films within Both Electrodes
- Lead Content Control in (Pb, La)(Zr, Ti)O3 Films Using Ar/O2 Sequential Rapid Thermal Process