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Department of Engineering Science, Kyoto University | 論文
- Electron-Microscopic Image of an Edge Dislocation Perpendicular to the Crystal Surface
- Planar Dechannelling of Energetic Ions at Dislocations. : III. Dechannelling at Edge Dislocations in Si
- Dechannelling of Fast Ions in Distorted Crystals. : II. Spherical Precipitates in Al-Zn Alloy
- Yield of Ion-Induced Secondary Electrons from Single Crystal
- Lattice Defects in Zinc Sulphide Whiskers
- Segregation of Copper from Supersaturated Solid Solution in Germanium
- An Evidence of Folding of Molecules in Polyethylene Single Crystal
- Channeling Radiation from 1 MeV Electrons
- Construction of GaAs Spin-Polarized Electron Source and Measurements of Electron Polarization
- Nitrogen Profile in SiO_xN_y Prepared by Thermal Nitridation of Ozone Oxide
- Theoretical Investigation of the Effects of Aerosol Characteristics on the Radiative Heat Transfer in the Atmospheric Boundary Layer
- Evidence of the Modulated Structure in Au-Ni Films
- Anomalous Surface Amorphization of Si(001) Induced by 3-5keV Ar^+ Ion Bombardment
- Theoretical Study on Radiative Properties of an Optically Thick Painted Layer Containing Spherical Pigment : Case of Normal Incidence
- Dissociation of MeV HeH^+ Ions at Glancing Angle Incidence on Clean (001) Surface of SnTe
- Glancing Angle Scattering of MeV H^+_2 Ions at a Clean(001)Surface of SnTe
- Theoretical Study on Radiative Properties of Doubly Painted Layer
- Study on Radiative Properties of Heat Resisting Metals and Alloys : 2nd Report, Optical Properties and Emissivities of Stainless Steels and Superalloys
- Nitrogen Depth Profiling in Ultrathin Silicon Oxynitride Films with High-Resolution Rutherford Backscattering Spectroscopy
- Oxidation of Si(001) Surfaces Studied by High-Resolution Rutherford Backscattering Spectroscopy