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Department of Electronics and Information Systems, Osaka University | 論文
- B-12-4 PERFORMANCE IMPROVEMENT OF SSFBG EN/DECODER BY APODIZATION
- Atomic configuration of boron pile-up at the Si/SiO2 interface
- Influences of Point and Extended Defects on As Diffusion in Si(Structure and Mechanical and Thermal Properties of Condensed Matter)
- Process Variation Compensation Technique for Voltage-controlled Ring Oscillator
- Analytical Expression Based Design of a Low-Voltage FD-SOI CMOS Low-Noise Amplifier(Analog Circuit Techniques and Related Topics)
- Accurate Small-Signal Modeling of FD-SOI MOSFETs(Advanced RF Technologies for Compact Wireless Equipment and Mobile Phones)
- A design of gain-boosted folded-cascode CMOS op-amp for SC circuits
- Wired CDMA Interface with Adaptivity for Interconnect Capacitances(Nonlinear Theory and its Applications)
- A CMOS IF Variable Gain Amplifier with Exponential Gain Control(Analog Circuit Techniques and Related Topics)
- CMOS Demodulator for Short-Range Wireless Interconnection Using ASK/CDMA Technique(Wide Band Systems)
- A New Analog Correlator Circuit for DS-CDMA Wireless Applications
- C-12-26 An Auto-sensitivity Control Circuit for DS-CDMA Receiver Circuit
- Novel Method of Intrinsic Characteristic Extraction in Lightly Doped Drain Metal Oxide Semiconductor Field Effect Transistors for Accurate Device Modeling
- IS-26 Improvement of physical growth and body composition analysis after small bowel transplantation(International Session V)
- Studies of Boron Segregation to {311} Defects in Silicon-Implanted Silicon
- Boron Segregation to {311} Defects Induced by Self-Implantation Damage in Si
- Boron Accumulation in the {311} Defect Region Induced by Self-Implantation into Silicon Substrate
- Role of Boron Atoms on Fluorine Diffusion under Various Stages of Annealing
- Boron Emission Rate from Si/SiO_2 Interface Traps to Bulk Silicon for Dose Loss Modeling
- Dependence of Gate Leakage Current on Location of Soft Breakdown Spot in Metal-Oxide-Semiconductor Field-Effect Transistor