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Department of Electronic Device Engineering, Kyushu University | 論文
- High Performance DC Superconducting Quantum Interference Device Utilizing a Bicrystal Junction with a 30° Misorientation Angle
- Thin CoSi_2 Formation on SiO_2 with Low-Energy Ion Irradiation
- Behavior of Defects Induced by Low-Energy Ions in Silicon Films
- Relationship between Critical Current Fluctuation of Superconducting Bicrystal Junction and Junction Parameters
- Direct-Coupled High T_c DC Superconducting Quantum Interference Device Magnetometers on SrTiO_3 Substrate : Theoretical Description and Comparison with Experiment
- A Recessed Channel MOSFET with Plasma-grown Silicon Oxynitride Gate Dielectric
- Simulated Characteristics of Deep-submicrometer Recessed Channel epi-MOSFETs
- Fabrication of Open-Top Microchannel Plate Using Deep X-Ray Exposure Mask Made with Silicon On Insulator Substrate
- Observation of On-Chip Electrophoresis Microcapillary Using Confocal Laser Scanning Microscopy
- Film Density Dependence of Polymethylmethacrylate Ablation under Synchrotron Radiation Irradiation
- Josephson Junction Array for the Measurement of High-Frequency Magnetic Fields
- Detection of Magnetic Nanoparticles with Superconducting Quantum Interference Device (SQUID) Magnetometer and Application to Immunoassays
- Properties of Josephson Junction Fabricated on Bicrystal Substrate with Different Misorientation Angles
- High-Performance MOS Tunneling Cathode with CoSi_2 Gate Electrode
- Low-Frequency Noise of High T_c Superconducting Quantum Interference Device(SQUID)Magnetometer Fabricated on Bicrystal Substrate
- Magnetic domain structure of micron-size Co line arrays
- Numerical Investigation of Stripe Structures in Ferromagnetic Thin Films with Perpendicular Anisotropy
- One-Dimensional Model of Magnetic Domain Wall with Self-Induced Anisotropy
- Material Dependence of Thermally Assisted Magnetization Reversal Properties in Microstructured Co/Pd Multilayers
- Magnetic and Electric Properties of Fe_3O_4 Thin Films Sputtered on Metallic Underlayer(Recent Progress in Oxide Thin Films by Sputtering)