スポンサーリンク
Department of Electrical and Computer Engineering University of Wisconsin-Madison | 論文
- An Alternative Test Generation for Path Delay Faults by Using N_i-Detection Test Sets(Test)(Dependable Computing)
- An Alternative Test Generation for Path Delay Faults by Using N_i-Detection Test Sets
- Diagnosing Crosstalk Faults in Sequential Circuits Using Fault Simulation(Special Issue on Test and Verification of VLSI)
- Testing Core-Based System-on-a-Chip Designs
- Compaction of Test Vectors for IDDQ Testing of Sequential Circuits
- Transistor Leakage Fault Diagnosis for CMOS Circuits(Special Issue on Test and Diagnosis of VLSI)
- Transistor Leakage Fault Diagnosis with I_DDQ and Logic Information
- Periodic motion representing isotropic turbulence
- Nb_3Sn-Pb Josephson Junctions Using Nb_3Sn Formed by Reaction of Nb/Sn Dual-Layer Films
- 完全故障検出効率を保証するレジスタ転送レベルデータパスの非スキャンテスト容易化設計法
- The Smallest Detectable Difference of Mandibular Function Impairment in Patients with a Painfully Restricted Temporomandibular Joint