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Department Of Materials Science Faculty Of Science Hiroshima University | 論文
- Raman Microprobe Study on Relaxation of Residual Stresses in Patterned Silicon-on-Sapphire
- Raman Scattering Characterization of Residual Stresses in Silicon-on-Sapphire
- Laser-Oscillating-Mode Dependence of Temperature Distributions in Laser Annealing of Semiconductors
- Elastic Constants of GaS and GaSe Layered Crystals Determined by Brillouin Scattering
- Brillouin Scattering in Layered Semiconductors using Microprocessor-controlled Fabry-Perot Interferometer : Physical Acoustics II
- Relief of Residual Strain in Silicon-on-Sapphire by Heat-Assisted Pulsed-Laser Annealing
- Anomalous Residual-Stress in Pulsed-Laser-Annealed Silicon-on-Sapphire Revealed by Raman Scattering
- Crystallization of Amorphous Silicon Layers RF-Sputtered on Sapphire by CW Ion Laser Annealing
- Brillouin Scattering in CdIn_2S_4 Crystal:Determination of Elastic Constants and Photoelastic Constants
- Coexistence of Surface and Bulk Acoustic Waves in Acoustoelectric Domains in Semiconducting CdS
- Infrared Study of Surface Phonon Modes in ZnO Small Crystals
- Transverse Electric Current Effect on Surface Acoustin Wave Propagation on Photoconductive CdS
- Optical Absorption for Acoustic Flux in Semiconductive CdS Single Crystal
- Complete Assignment of Spin Domains in Antiferromagnetic NiO(100) by Photoemission Electron Microscopy and Cluster Model Calculation
- New Polytypes in the Co-rich Sm-Co system
- Direct Observation of the Intersection of Sequence Faults in the Fe-Cr σ-Phase
- Formation process of the amorphous MgNi by mechanical alloying
- Short Range Order Diffuse Scattering from ζ Phase Ag-Al
- Short Range Order Diffuse Scattering from Disordered ζ Phase, Ag-Al
- TEM Observation of Micrometer-Sized Ni Powder Particles Thinned by FIB Cutting Technique